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| 📄 | 0_0_AEC_US_Reliability_Workshop_2026_Agenda.pdf | 484.2 KB | 2026-03-27 15:43 |
| 📄 | 1_1_AECQ200_Case_Study_JohnDeere_Brandt.pdf | 2.0 MB | 2026-03-26 16:15 |
| 📄 | 1_2_SemiPass_Qualifications-TI-Webber.pdf | 660.4 KB | 2026-03-27 08:07 |
| 📄 | 1_3_AEC-Q200-Proposal_for_Assessing_EV Mission Profiles-YAGEO-Cooper.pdf | 427.6 KB | 2026-03-23 09:20 |
| 📄 | 4_1_Challenges_for_FA_of_secure_flash_memory-Macronix-Grogan.pdf | 1.8 MB | 2026-03-23 09:21 |
| 📄 | 6_1_Reliability_First-Infineon-Lewitschnig.pdf | 567.4 KB | 2026-03-23 09:16 |
| 📄 | 6_2_Compact_IP_Models_for_Electronics_Reliability_Supply_Chain-Synopsys-He.pdf | 3.0 MB | 2026-03-26 22:42 |
| 📄 | 6_3_Automating the Control Plan from the PFMEA-Micron-Capron.pdf | 1.4 MB | 2026-03-23 09:16 |
| 📄 | 6_4_SiC_paper_final-VW-KLA-Lingampalli.pdf | 3.7 MB | 2026-03-23 09:18 |
| 📄 | 6_5_Superelement_Models_in_Active-Thermal Cycle_w_Temp_Dependencies-Synopsys-He.pdf | 5.4 MB | 2026-03-23 09:19 |
| 📄 | 7_1_ESD_Module_DCI-CBE_Testing-Micron-OSullivan.pdf | 1.9 MB | 2026-03-23 09:12 |
| 📄 | AEC Standards - Revision - Age - March 2026.pdf | 313.6 KB | 2026-03-24 21:12 |